Optical Inspection and Micromeasurements (Proceedings EurOpt series) ePub download
by Christophe Gorecki
- ISBN: 0819421685
- ISBN13: 978-0819421685
- ePub: 1836 kb | FB2: 1671 kb
- Language: English
- Category: Engineering
- Publisher: SPIE Press (October 31, 1997)
- Pages: 858
- Rating: 4.6/5
- Votes: 849
- Format: lit mobi doc rtf
Optical inspection and micromeasurements 2 Proceedings EurOpt series (Том 3) Proceedings of SPIE-the International . Christophe Gorecki, European Optical Society, Society of Photo-optical Instrumentation Engineers.
Optical inspection and micromeasurements 2 Proceedings EurOpt series (Том 3) Proceedings of SPIE-the International Society for Optical Engineering (Том 3098) SPIE proceedings series, v. 3098 Optical inspection and micromeasurements II: 16-19 June 1997, Munich, FRG (Том 3098).
Optical Inspection And Micromeasurements book.
Optical Inspection and Micromeasurements. Proceeding from the photothermal signals' amplitude and phase the depths and profiles of thermal conductivity variations can be reconstructed. 13 Sessions, 89 Papers, 0 Presentations. Certainly, mechanical changes on surfaces and in near-surface layers, cracks and plastic deformations as well as alterations of the microcrystalline structures are responsible for these effects.
Conference: Conference on Optical Micro- and Nanometrology V, Volume: 9132. Cite this publication.
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11060: Optical Methods for Inspection, Characterization and Imaging of. .
11060: Optical Methods for Inspection, Characterization and Imaging of Biomaterials (Ferraro, Grilli, Ritsch-Marte, Hitzenberger). 11061: Automated Visual Inspection and Machine Vision (Beyerer, Puente León). 29. General Information. 30-32 Proceedings of SPIE.
Proceedings of SPIE are among the most cited references in patent literature. Format Paperback 277 pages.
Optical Inspection of Microsystems. Article · January 2006 with 67 Reads of a series of cantilevers. Article · January 2006 with 67 Reads. Measurement of the shape, surface quality, and optical performance of micro-lenses, as well as, the uniformity of the parameters across the wafer is an important issue. In this paper we describe a ion microscopic interferometer for characterization of micro-lens array. of a series of cantilevers. This approach offers a non-contact and accurate measurement under harsh environmental conditions to monitor behavior changes of our samples due to the evolution of residual stress and electrical loading.